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posted on 2025-02-11, 13:02 authored by Tom Iung, Lucía Pérez Ramírez, Andrei Gloskovskii, Chen-Yi Cho, Ming-Yeh Lao, Sourav De, Tuo-Hung Hou, Christophe LUBIN, Mickael Gros-Jean, Nicholas Barrett
XPS-based stoichiometry measurements, bottom interface analysis, and the method for determining the characteristic probing depth.

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    Applied Physics Letters

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    Stoichiometry measurementsBottom interfaceXPS

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