Supplementary Material
dataset
posted on 2025-02-11, 13:02 authored by Tom Iung, Lucía Pérez Ramírez, Andrei Gloskovskii, Chen-Yi Cho, Ming-Yeh Lao, Sourav De, Tuo-Hung Hou, Christophe LUBIN, Mickael Gros-Jean, Nicholas BarrettXPS-based stoichiometry measurements, bottom interface analysis, and the method for determining the characteristic probing depth.
