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posted on 2024-08-14, 12:00 authored by Chiwen Qian, Hui Guo, Chao Han, Zhenlin Lu, Hao Yuan, Yu-Ming Zhang
The details about the radioactive source energy spectra and energy deposition in SiC obtained by FLUKA simulation, the analytical calculation of semiconductor conversion device parameters, and the recombination loss distribution in semiconductor conversion devices.

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    Applied Physics Letters

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