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Supplementary Material

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posted on 2024-05-14, 11:50 authored by Quentin Guillet, Hervé Boukari, Fadi Choueikani, Philippe Ohresser, Abdelkarim Ouerghi, Florie Mesple, Vincent Renard, Jean-François Jacquot, Denis Jalabert, Céline Vergnaud, Frederic Bonell, Alain Marty, Matthieu Jamet
I. Rutherford Backscattering method II. X-ray diffraction method III. X-ray magnetic circular dichroism measurements and data analysis

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    Applied Physics Letters

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