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posted on 2024-10-17, 12:01
authored by
Ken Ishida
,
Kota Sato
,
Pham Nam Hai
1. Atomic force microscopy and transmission electron microscopy measurement 2. Full width at half maximum of the Pt(111) XRD peaks and estimation of grain sizes
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Categories
Engineering
Keywords
AFM
TEM
XRD
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CC BY-NC 4.0
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