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posted on 2025-11-04, 13:02 authored by Wassim Hamouda, Yoshiyuki Yamashita, Shigenori Ueda, Sylvia Matzen, Olivier Renault, Furqan Mehmood, Thomas Mikolajick, Uwe Schroeder, Nicholas Barrett
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    DOI - Is supplement to Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> ferroelectric capacitors probed by hard X-ray photoelectron spectroscopy

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    Applied Physics Letters

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    Electrostatic potentialSchottky barrier heightcurve fitting

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