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posted on 2024-07-08, 04:01 authored by Wuyi Qi, Fucong Fei, Zhixin Zhang, Bo Chen, Hangkai Xie, Boyuan Wei, Shuai Zhang, Fengqi Song
See Supplemental Material for more details of the atomic force microscopy (AFM) image and height profiles of devices, exchange bias measurement under another method and raw data.

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    Applied Physics Letters

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    Keywords

    Exchange Biasvan de Waals HeterostructuresTopological InsulatorsAnomalous Hall Effect

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    CC BY 4.0

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