Supplemental
dataset
posted on 2025-10-27, 04:06 authored by Ezra Pasikatan, George Antonelli, Nicholas Keller, Markus Kuhn, Satoshi Murakami, Subhadeep Kal, Matthew Rednor, Kandabara Tapily, Dave Hetzer, Mark Schaefer, Kevin Musick, Alain DieboldThe supplemental section contains a figure showing the effective dielectric constant (EDC), effective medium approximation (EMA), bulk silicon and bulk Si0.73Ge0.27 are shown for a 4X superlattice of Si/Si(1-x)Ge(x). It also contains data detailed tables for individual layer thickness values and the amount of cavity etch.
