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posted on 2023-12-26, 05:00 authored by Henryk Turski1,2, Mikolaj Chlipala1, Ewelina Zdanowicz3, Ernest Rogowicz4, Grzegorz Muziol1, Joanna Moneta1, Szymon Grzanka1, Marcin Kryś, ko1, Marcin Syperek4, Robert Kudrawiec3, Czeslaw Skierbiszewski1
Additional data regarding the sample structure, as well as details on AFM and XRD characterizations.

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    Journal of Applied Physics

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    Keywords

    atomic force microscopyXRD

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    CC BY 4.0

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