Supplement TABLE S1, Supplement FIG S1, Supplement FIG S2, Supplement FIG S3, Supplement FIG S4, Supplement Moive S1.,,

TABLE S1. Parameters used in coupled numerical analysis. FIG. S1. The finite element model of the DMCs. FIG. S2. Correlation between the EWOD force and the dielectric layer permittivity. FIG. S3. Correlation between EWOD force and the dielectric layer thickness (frequency = 102 Hz). FIG. S4. Simulation result. Movie S1: Droplet and particle driving experiments in digital microfluidic chips.