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Supplement Number 1

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posted on 2024-12-23, 05:04 authored by Tomoharu Kimura, Kei Kobayashi, Yuji Yamagishi, Hirofumi Yamada
Whole signal measured by tr-EFM

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    Applied Physics Letters

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    Keywords

    electrostatic force microscopytime-resolved measurementorganic thin films

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    CC BY 4.0

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