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posted on 2024-07-29, 04:00 authored by Sikang Zheng, Bin Zhang, Zizhen Zhou, Ang Li, Guang Han, Xu Lu, Guoyu Wang, Xiaodong Han, Xiaoyuan Zhou
See the supplementary material for crystal growth, phase, and quality examinations; TEM characterization of stacking fault structures; detailed explanation of the HAADF image processing; specific parameters of the extrema positions in the valence band.

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    Applied Physics Letters

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    Keywords

    SnSeStacking faultsThermoelectricVan der Waals layered materials

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    CC BY 4.0

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