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https://doi.org/10.60893/figshare.jap.29109479
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posted on 2025-06-09, 04:06
authored by
Luis Azevedo Antunes
,
Sebastian Obernberger
,
Paul Schwermer
,
Joshua Hintz
,
Richard Ganser
,
Uwe Schroeder
,
Thomas Mikolajick
,
Alfred Kersch
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Is supplement to
Kinetic Monte Carlo Simulation Reveals Defect Charge Accumulation Favouring Ferroelectric Phase Formation in Hf1-xZrxO2 ThinFilms
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