Refractive index of CdSe/CdZnS NPLs

Name: Refractive index of CdSe/CdZnS NPLs
Published: 2025-05-20T12:03:49+00:00
License: https://creativecommons.org/licenses/by/4.0/
Keywords: Ellipsometry of thin films, Variable Stripe Length Method, Mode-confinement factor

https://doi.org/10.60893/figshare.apl.28924592

dataset

posted on 2025-05-20, 12:03 authored by Ruslan Azizov, Jinlong Zhu, Pavel Talianov, Furkan Isik, Hilmi Volkan Demir, Sergey Makarov

Ellipsometry measurements result of 69.96 nm thick film with Rms = 3.59 nm

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Keywords

Ellipsometry of thin films Variable Stripe Length Method Mode-confinement factor

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CC BY 4.0